TeraNova @ SPIE AR|VR|MR
TeraNova invited at the SPIE AR | VR | MR conference in San Francisco to give a mainstage presentation of TeraNova’s LabScatter for high-throughput, non-destructive, and large-area metrology of nanostructures, gratings, and thin films. Interested in this fantastic instrument? then visit www.teranova.nl